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Oxide and Nitride Thin Film Standards
Dual Step Height Standards for
Profilometers and AFMs
Dual Thickness Metal Standards
PSI Standards
PSI Oxide and Nitride Thin Film Standards PSI Dual Step Height Standards for Profilometers and AFMs PSI Dual Thickness Metal Standards

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PSI Standards are the NIST traceable calibration standards made by Process Specialities. Oxide and Nitride thin film standards, dual step height standards and dual thickness metal standards are available. In addition to the calibrated area, useful diagnostic features are part of the design of each standard. The diagnostic features allow the user to check important parameters of the instrument which contribute to signal quality and measurement results. PSI is ANSI/NCSL Z540-1 compliant and has received ISO/IEC 17025 accreditation from NVLAP/NIST.