Film Thickness Metrology

Foothill Instruments offers a variety of table-top systems for a wide range of film thickness applications. The products are very well suited for thick films as used in MEMS applications.

Key Features:

Dielectric range: 40 nm to 500 µm

Advanced mapping and SPC

Fast & simple to operate

No focussing required

Export data via network

More details could be found at at Foothill Instruments' web site