Non-Contact Suface Profiler for Hard Disks

The MP2200 is a high resolution profiler for the hard disk industry. It is designed to be used as both a disk production tool for in-line quality inspection, as well as a research and development tool for establishing standards and researching tolerances. The MP2200 utilizes the same non-contact optical measurement technology as other Chapman profilers, but features a shorter wavelength light source (543 nm). This green laser allows the MP2200 to make higher resolution measurements with up to 100X magnification objectives, with a finer sampling interval (50 nm). Users can make complete, high-resolution OD circumferential scans in less than 30 seconds.

The MP2200 offers the following key features:

Sub-Angstrom height resolution

50 nm sampling

0.33 µm lateral resolution

Scan lengths ranging from microns to 100 mm

Profile and waviness data from a single scan

More details could be found at Chapman Instruments' web site